Content last revised: 2008/12/30
Subchapters
- A (525.1-525.2),
- B (525.21-525.255),
- C (525.301-525.581),
- D (525.601-525.899),
- E (525.901-525.1207),
- F (525.1301-525.1461),
- G (525.1501-525.1587)
- H (525.1701-525.1733)
Appendices
A, B, C, D, E, F, G, H, I, J, K, L, M, N, O
(amended 2008/10/30; no previous version)
Appendix L
(amended 2008/10/30; no previous version)
HIRF Environments and Equipment HIRF Test Levels
(amended 2008/10/30; no previous version)
This appendix specifies the HIRF environments and equipment HIRF test levels for electrical and electronic systems under 525.1317. The field strength values for the HIRF environments and equipment HIRF test levels are expressed in root-mean-square units measured during the peak of the modulation cycle.
(amended 2008/10/30; no previous version)
- (a) HIRF environment I is specified in the following table:
(amended 2008/10/30; no previous version)
Frequency | Field Strength (volts/meter) | |
---|---|---|
Peak | Average | |
10 kHz – 2 MHz | 50 | 50 |
2 MHz – 30 MHz | 100 | 100 |
30 MHz – 100 MHz | 50 | 50 |
100 MHz – 400 MHz | 100 | 100 |
400 MHz – 700 MHz | 700 | 50 |
700 MHz – 1 GHz | 700 | 100 |
1 GHz – 2 GHz | 2000 | 200 |
2 GHz – 6 GHz | 3000 | 200 |
6 GHz – 8 GHz | 1000 | 200 |
8 GHz – 12 GHz | 3000 | 300 |
12 GHz – 18 GHz | 2000 | 200 |
18 GHz – 40 GHz | 600 | 200 |
In this table, the higher field strength applies at the frequency band edges | ||
(amended 2008/10/30; no previous version) |
- (b) HIRF environment II is specified in the following table:
(amended 2008/10/30; no previous version)
Frequency | Field Strength (volts/meter) | |
---|---|---|
Peak | Average | |
10 kHz – 500 kHz | 20 | 20 |
500 kHz – 2 MHz | 30 | 30 |
2 MHz – 30 MHz | 100 | 100 |
30 MHz – 100 MHz | 10 | 10 |
100 MHz – 200 MHz | 30 | 10 |
200 MHz – 400 MHz | 10 | 10 |
400 MHz – 1 GHz | 700 | 40 |
1 GHz – 2 GHz | 1300 | 160 |
2 GHz – 4 GHz | 3000 | 120 |
4 GHz – 6 GHz | 3000 | 160 |
6 GHz – 8 GHz | 400 | 170 |
8 GHz – 12 GHz | 1230 | 230 |
12 GHz – 18 GHz | 730 | 190 |
18 GHz – 40 GHz | 600 | 150 |
In this table, the higher field strength applies at the frequency band edges | ||
(amended 2008/10/30; no previous version) |
- (c) Equipment HIRF Test Level 1
(amended 2008/10/30; no previous version)- (1) From 10 kilohertz (kHz) to 400 megahertz (MHz), use conducted susceptibility tests with continuous wave (CW) and 1 kHz square wave modulation with 90 percent depth or greater. The conducted susceptibility current shall start at a minimum of 0.6 milliamperes (mA) at 10 kHz, increasing 20 decibels (dB) per frequency decade to a minimum of 30mA at 500 kHz.
(amended 2008/10/30; no previous version) - (2) From 500 kHz to 40 MHz, the conducted susceptibility current shall be at least 30mA.
(amended 2008/10/30; no previous version) - (3) From 40 MHz to 400 MHz, use conducted susceptibility tests, starting at a minimum of 30 mA at 40 MHz, decreasing 20 dB per frequency decade to a minimum of 3 mA at 400 MHz.
(amended 2008/10/30; no previous version) - (4) From 100 MHz to 400 MHz, use radiated susceptibility tests at a minimum of 20 volts per meter (V/m) peak with CW and 1 kHz square wave modulation with 90 percent depth or greater.
(amended 2008/10/30; no previous version) - (5) From 400 MHz to 8 gigahertz (GHz), use radiated susceptibility tests at a minimum of 150 V/m peak with pulse modulation of 4 percent duty cycle with a 1kHz pulse repetition frequency. This signal shall be switched on and off at a rate of 1 Hz with a duty cycle of 50 percent.
(amended 2008/10/30; no previous version)
- (1) From 10 kilohertz (kHz) to 400 megahertz (MHz), use conducted susceptibility tests with continuous wave (CW) and 1 kHz square wave modulation with 90 percent depth or greater. The conducted susceptibility current shall start at a minimum of 0.6 milliamperes (mA) at 10 kHz, increasing 20 decibels (dB) per frequency decade to a minimum of 30mA at 500 kHz.
- (d) Equipment HIRF Test Level 2
(amended 2008/10/30; no previous version) - Equipment HIRF test level 2 is HIRF environment II in table II of this appendix reduced by acceptable aircraft transfer function and attenuation curves. Testing shall cover the frequency band of 10 kHz to 8 GHz.
(amended 2008/10/30; no previous version) - (e) Equipment HIRF Test Level 3
(amended 2008/10/30; no previous version)- (1) From 10 kHz to 400 MHz, use conducted susceptibility tests, starting at a minimum of 0.15 mA at 10 kHz, increasing 20 dB per frequency decade to a minimum of 7.5 mA at 500 kHz.
(amended 2008/10/30; no previous version) - (2) From 500 kHz to 40 MHz, use conducted susceptibility tests at a minimum of 7.5mA.
(amended 2008/10/30; no previous version) - (3) From 40 MHz to 400 MHz, use conducted susceptibility tests, starting at a minimum of 7.5 mA at 40 MHz, decreasing 20 dB per frequency decade to a minimum of 0.75 mA at 400 MHz.
(amended 2008/10/30; no previous version) - (4) From 100 MHz to 8 GHz, use radiated susceptibility tests at a minimum of 5 V/m.
(amended 2008/10/30; no previous version)
- (1) From 10 kHz to 400 MHz, use conducted susceptibility tests, starting at a minimum of 0.15 mA at 10 kHz, increasing 20 dB per frequency decade to a minimum of 7.5 mA at 500 kHz.